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1

Controlled synthesis of SiC nanoparticles from surface silicon contamination

Borowik, Łukasz, Chevalier, Nicolas, Mariolle, Denis, Martinez, Eugénie, Bertin, François, Chabli, Amal, Barbé, Jean-Charles

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 936 KB

english, 2013

2

Medium resolution off-axis electron holography with millivolt sensitivity

Cooper, David, Truche, Robert, Rivallin, Pierrette, Hartmann, Jean-Michel, Laugier, Frederic, Bertin, Francois, Chabli, Amal, Rouviere, Jean-Luc

Journal:

Applied Physics Letters

Year:

2007

Language:

english

File:

PDF, 562 KB

english, 2007

3

Porosimetry Measurements on Low Dielectric Constant—Thin Layers by Coupling Spectroscopic Ellipsometry and Solvent Adsorption-Desorption

Patrick Revol, Damien Perret, François Bertin, Florence Fusalba, Vincent Rouessac, Amal Chabli, Gérard Passemard, André Ayral

Journal:

Journal of Porous Materials

Year:

2005

Language:

english

File:

PDF, 1.10 MB

english, 2005

4

Drying nano particles solution on an oscillating tip at an air liquid interface: what we can learn, what we can do

Charlotte Bernard, Jean-Pierre Aimé, Sophie Marsaudon, Raphaël Levy, Anne Marie Bonnot, Cattien Nguyen, Denis Mariolle, François Bertin, Amal Chabli

Journal:

Nanoscale Research Letters

Year:

2007

Language:

english

File:

PDF, 477 KB

english, 2007

5

Catalyst preparation for CMOS-compatible silicon nanowire synthesis

Renard, Vincent T., Jublot, Michael, Gergaud, Patrice, Cherns, Peter, Rouchon, Denis, Chabli, Amal, Jousseaume, Vincent

Journal:

Nature Nanotechnology

Year:

2009

Language:

english

File:

PDF, 482 KB

english, 2009

6

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Current Voltage Characteristics through Grains and Grain Boundaries of High-k Dielectric Thin Films Measured by Tunneling Atomic Force Microscopy

Murakami, Katsuhisa, Rommel, Mathias, Yanev, Vasil, Bauer, Anton J., Frey, Lothar, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 1.57 MB

english, 2011

7

Z-contrast cryo-electron tomography probes shell porosity in multi-shell nanocomposites

Wai Li Ling, Peter D. Cherns, Jorice Samuel, Olivier Raccurt, Olivier Poncelet, Amal Chabli

Journal:

Journal of Nanoparticle Research

Year:

2012

Language:

english

File:

PDF, 395 KB

english, 2012

8

Fracture toughness of pure and in-doped GaAs

Gérard Michot, Amand George, Amal Chabli-Brenac, Engin Molva

Journal:

Scripta Metallurgica

Year:

1988

Language:

english

File:

PDF, 1.23 MB

english, 1988

9

The influence of strain on dewetting of silicon films

Borowik, Łukasz, Chevalier, Nicolas, Mariolle, Denis, Bertin, François, Chabli, Amal, Barbé, Jean-Charles

Journal:

Journal of Applied Physics

Year:

2013

Language:

english

File:

PDF, 1.21 MB

english, 2013

10

Une localisation inhabituelle d’hidradénome

Housni Alaoui, I., Hocar, O., Hamdaoui, A., Chabli, H., Akhdari, N., Amal, S.

Journal:

Médecine et Chirurgie du Pied

Year:

2014

Language:

french

File:

PDF, 384 KB

french, 2014

11

Intérêt de l’hydroxyde de potassium 5 % dans le traitement du molluscum contagiosum

Chabli, H., Hocar, O., Akhdari, N., Amal, S.

Journal:

Annales de Dermatologie et de Vénéréologie

Year:

2013

Language:

french

File:

PDF, 77 KB

french, 2013

12

Ad index

Chabli, H., Hocar, O., Akhdari, N., Amal, S.

Journal:

Journal of Air Medical Transport

Year:

1992

Language:

english

File:

PDF, 89 KB

english, 1992

13

Incontinentia pigmenti avec le stade vésiculaire in utero

Chabli, H., Hocar, O., Akhdari, N., Rais, H., Belaabidia, B., Amal, S.

Journal:

Annales de Dermatologie et de Vénéréologie

Year:

2013

Language:

french

File:

PDF, 67 KB

french, 2013

14

Histiocytose langerhansienne hypophysaire et cutanée associée à un diabète sucré

Chegour, H., Chabli, H., El Mghari, G., El Akhdari, N., Amal, S., El Ansari, N.

Journal:

Annales d'Endocrinologie

Year:

2013

Language:

french

File:

PDF, 493 KB

french, 2013

15

Optical properties of Cd1−xMgxTe epitaxial layers: A variable-angle spectroscopic ellipsometry study

Luttmann, Michel, Bertin, François, Chabli, Amal

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 780 KB

english, 1995

16

Quantitative dopant profiling of laser annealed focused ion beam-prepared silicon p-n junctions with nanometer-scale resolution

Cooper, David, Hartmann, Jean-Michel, Aventurier, Bernard, Templier, Francois, Chabli, Amal

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 826 KB

english, 2008

17

A hard x-ray nanoprobe for scanning and projection nanotomography

Bleuet, Pierre, Cloetens, Peter, Gergaud, Patrice, Mariolle, Denis, Chevalier, Nicolas, Tucoulou, Rémi, Susini, Jean, Chabli, Amal

Journal:

Review of Scientific Instruments

Year:

2009

Language:

english

File:

PDF, 489 KB

english, 2009

18

Erratum: “A hard x-ray nanoprobe for scanning and projection nanotomography” [Rev. Sci Instrum. 80, 056101 (2009)]

Bleuet, Pierre, Cloetens, Peter, Gergaud, Patrice, Mariolle, Denis, Chevalier, Nicolas, Tucoulou, Rémi, Susini, Jean, Chabli, Amal

Journal:

Review of Scientific Instruments

Year:

2009

Language:

english

File:

PDF, 306 KB

english, 2009

19

Extending the detection limit of dopants for focused ion beam prepared semiconductor specimens examined by off-axis electron holography

Cooper, David, Rivallin, Pierrette, Hartmann, Jean-Michel, Chabli, Amal, Dunin-Borkowski, Rafal E.

Journal:

Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 644 KB

english, 2009

20

Multiple internal reflection infrared spectroscopy using two-prism coupling geometry: A convenient way for quantitative study of organic contamination on silicon wafers

Rochat, Névine, Olivier, Michel, Chabli, Amal, Conne, Francis, Lefeuvre, Georges, Boll-Burdet, Christophe

Journal:

Applied Physics Letters

Year:

2000

Language:

english

File:

PDF, 307 KB

english, 2000

21

Acropathies ulcéromutilantes : à propos de 4 cas et revue de la littérature; Acrodystrophic neuropathy: Four case reports and review of the litterature;

Chabli, H., Akhdari, N., Hocar, O., Amal, S.

Journal:

Médecine et Chirurgie du Pied

Year:

2015

Language:

french

File:

PDF, 580 KB

french, 2015

22

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Energy-filtered Photoelectron Emission Microscopy (EF-PEEM) for imaging nanoelectronic materials

Renault, Olivier, Chabli, Amal, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

Year:

2007

Language:

english

File:

PDF, 937 KB

english, 2007

23

[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Characterization of Integrated Nano Materials

Chabli, Amal, Cherns, Peter, Chevalier, Nicolas, Cooper, David, Lafond, Dominique, Bertin, François, Blanc, Henri, Brenac, Ariel, Andreucci, Philippe, Gabriel, Jean-Christophe, Secula, Erik M., Seile

Year:

2009

Language:

english

File:

PDF, 4.51 MB

english, 2009

24

[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Understanding the phase images from off-axis electron holography

Cooper, David, Hartmann, Jean-Michel, Barnes, Jean-Paul, Chabli, Amal, Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Michael Garner, C., McDonald, Robert, Diebold, Alain C.

Year:

2009

Language:

english

File:

PDF, 2.81 MB

english, 2009

25

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - UV-Photoreflectance and Raman Characterization of Strain Relaxation in Si on Silicon-Germanium Films

Current, Michael, Chism, Will, Yoo, Woo Sik, Vartanian, Victor, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 518 KB

english, 2011

26

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Characterization and Failure Analysis of 3D Integrated Systems using a novel plasma-FIB system

Kwakman, Laurens, Franz, German, Taklo, Maaike Margrete Visser, Klumpp, Armin, Ramm, Peter, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 516 KB

english, 2011

27

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - SiC Epitaxial Layer Resistivity Monitoring; A look at Existing and Novel Electrical Methods

Hillard, Robert J., Tsidilkovski, Edward, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 231 KB

english, 2011

28

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Annealed Si∕SiGeC Superlattices Studied by Dark-Field Electron Holography, ToF-SIMS and Infrared Spectroscopy

Denneulin, T., Rouvière, J. L., Béché, A., Py, M., Barnes, J. P., Rochat, N., Hartmann, J. M., Cooper, D., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 444 KB

english, 2011

29

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Advanced Metrologies for Topography and Thickness Measurements

Riou, G., Acosta, P., Darwin, M., Kamenev, B., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 261 KB

english, 2011

30

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Fourier Scatterometry for Characterization of Sub-wavelength Periodic Two Photon Polymerization Structures

Frenner, K., Paz, V. Ferreras, Peterhänsel, S., Osten, W., Ovsianikov, A., Obata, K., Chichkov, B., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 242 KB

english, 2011

31

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Characterization Of Nanodevices By STEM Tomography

Richard, O., Vandooren, A., Kar, G. S., Van Marcke, P., Bender, H., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 517 KB

english, 2011

32

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Advanced Use of Therma-Probe for Ultra-Shallow Junction Monitoring

Bogdanowicz, Janusz, Clarysse, Trudo, Smets, Gerrit, Rosseel, Erik, Vandervorst, Wilfried, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 286 KB

english, 2011

33

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Overview of Optical Metrology of Advanced Semiconductor Materials

Kamineni, Vimal K., Diebold, A. C., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 626 KB

english, 2011

34

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Thin Films Mechanical Characterization Using Colored Picosecond Acoustics

Emery, Patrick, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 536 KB

english, 2011

35

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - High Resolution Multiwavelength μ-Raman Spectroscopy for Nanoelectronic Material Characterization Applications

Vartanian, Victor, Ueda, Takeshi, Ishigaki, Toshikazu, Kang, Kitaek, Yoo, Woo Sik, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 260 KB

english, 2011

36

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Metrology and Failure Analysis for 3D IC Integration

Zschech, Ehrenfried, Diebold, Alain, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 1.03 MB

english, 2011

37

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Frontiers of More than Moore in Bioelectronics and the Required Metrology Needs

Guiseppi-Elie, Anthony, Kotanen, Christian, Wilson, A. Nolan, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 521 KB

english, 2011

38

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Enhanced Spatial Resolution Electrical Scanning Probe Microscopy By Using Carbon Nanotube Terminated Tips

Kopanski, Joseph J., Sitnitsky, Ilona, Vartanian, Victor, McClure, Paul, Mancevski, Vladimir, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 485 KB

english, 2011

39

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Metrology and Characterization Challenges for Emerging Research Materials and Devices

Garner, C. Michael, Herr, Dan, Obeng, Yaw, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 118 KB

english, 2011

40

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Analysis of the Noble Metals on Silicon Wafers by Chemical Collection and ICPMS

Fontaine, H., Hureau, D., Groz, M., Despois, D., Louis, C., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 175 KB

english, 2011

41

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Standards for Nano-Enabled Applications of Electronics: Perspectives from IEC

Fabricius, Norbert, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 309 KB

english, 2011

42

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Thickness Variation of HfO[sub 2] Films Under Post-Deposition Annealing Investigated By X-ray Reflectivity and X-ray Photoelectron Spectroscopy

Chang, Yong-Qing, Fu, Wei-En, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 338 KB

english, 2011

43

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Hybrid Metrology & 3D-AFM Enhancement for CD Metrology Dedicated to 28 nm Node and Below Requirements

Foucher, J., Faurie, P., Dourthe, L., Irmer, B., Penzkofer, C., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 1.00 MB

english, 2011

44

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Analytical Study of BAM (Al∕GaAs) and Photovoltaic Samples Using State-of-The-Art Auger Nanoprobes

Yadav, P., Bouttemy, M., Martinez, E., Vigneron, J., Renault, O., Mur, P., Munoz, D., Etcheberry, A., Chabli, A., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 373 KB

english, 2011

45

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - The Impact Of Organic Contamination On The Oxide-Silicon Interface

Codegoni, D., Polignano, M. L., Castellano, L., Borionetti, G., Bonoli, F., Nutsch, A., Leibold, A., Otto, M., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 197 KB

english, 2011

46

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Positioning More Than Moore Characterization Needs and Methods within the 2011 ITRS

Graef, Mart, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 204 KB

english, 2011

47

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Effects of Roughness on Scatterometry Signatures

Foldyna, M., Germer, T. A., Bergner, B. C., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 1.18 MB

english, 2011

48

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Atomic Layer Deposited Al[sub 2]O[sub 3] as Characterized Reference Samples for Nanolayer Metrology

Nutsch, A., Lemberger, M., Petrik, P., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 347 KB

english, 2011

49

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Line Edge Roughness of Directed Self-Assembly PS-PMMA Block Copolymers—A Candidate for Future Lithography

Wang, Chengqing, Stein, Gila E., Bosse, August W., Wu, Wen-li, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 910 KB

english, 2011

50

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Multi-technique Approach for the Evaluation of the Crystalline Phase of Ultrathin High-k Gate Oxide Films

Bersch, E., LaRose, J. D., Wells, I., Consiglio, S., Clark, R. D., Leusink, G. J., Matyi, R. J., Diebold, A. C., Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 181 KB

english, 2011